Ellipsometry of Functional Organic Surfaces and Films
Christoph Cobet (auth.), Karsten Hinrichs, Klaus-Jochen Eichhorn (eds.)Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Kategorien:
Jahr:
2014
Auflage:
1
Verlag:
Springer-Verlag Berlin Heidelberg
Sprache:
english
Seiten:
363
ISBN 10:
3642401287
ISBN 13:
9783642401282
Serien:
Springer Series in Surface Sciences 52
Datei:
PDF, 12.81 MB
IPFS:
,
english, 2014
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